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Comparison of Low Frequency Noise in Channel and Gate-Induced Drain Leakage Currents of High-k nFETs

Journal

IEEE Elect. Dev. Lett.

Vol

31(10)

Page

1086-1088

Author

J.W. Lee, B.H. Lee, H.C. Shin, J.H. Lee

Year

2010

Date

2010.08.12

doi

10.1109/LED.2010.2058839

File

2010_EDL_JWLEE2.pdf (306.0K) 0회 다운로드 DATE : 2021-04-02 13:54:51

Link

http://10.1109/LED.2010.2058839 91회 연결