포항공대 EESL Fearless challenge

Indicators of mobility extraction error in bottom gate CdS metal-oxide-semiconductor field-effect transistors

Journal

Applied Physics Letters

Vol

101 (18)

Page

182106

Author

U. Jung, Y.G. Lee, J.J. Kim, S.K. Lee, I. Mejia, A. Salas-Vwilasenor, M. Quevedo-Lopez, B.H. Lee

Year

2012

Date

2012.10.29

doi

http://doi.org/10.1063/1.4765067

File

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Link

http://doi.org/10.1063/1.4765067 207회 연결