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    • Enhancing Reliability in Oxide-Based Memristors Using Two-Dimensional Transition Metal Dichalcogenides
    Journal
    Applied Surface Science
    Vol
    679
    Page
    161216
    Author
    D.H. Lee, S.M. Kim, J.C. Park, Y.S. Jung, S.Y. Lee, B.H. Lee, S. Lee
    Year
    2025
    Date
    2025
    File
    ASS DHLEE 2025.pdf (1.9M) 4회 다운로드 DATE : 2025-03-04 15:35:54