목록 게시판 리스트 옵션 검색 Enhancing Reliability in Oxide-Based Memristors Using Two-Dimensional Transition Metal Dichalcogenides Journal Applied Surface Science Vol 679 Page 161216 Author D.H. Lee, S.M. Kim, J.C. Park, Y.S. Jung, S.Y. Lee, B.H. Lee, S. Lee Year 2024 Date 2024 File 2024 ASS DHLee.pdf (1.9M) 2회 다운로드 DATE : 2024-09-17 10:13:32
