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Quantitative analysis of hysteretic reactions at the interface of graphene and SiO2 using short pulse I-V method

Journal

Carbon

Vol

60

Page

p.453-460

Author

Y.G.Lee, C.G.Kang, C.Cho, Y.H.Kim, H.J.Hwang, B.H.Lee*

Year

2013

Date

2013.08

doi

http://dx.doi.org/10.1016/j.carbon.2013.04.060

File

2013_Carbon_YGLee.pdf (1.6M) 2회 다운로드 DATE : 2021-03-30 22:13:37

Link

http://dx.doi.org/10.1016/j.carbon.2013.04.060 196회 연결