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    • Channel Defect Profiling and Passivation for ZnO Thin-Film Transistors
    Journal
    Nanomaterials
    Vol
    10(6)
    Page
    1186
    Author
    S.C. Kang, S.Y. Kim, S.K. Lee, K. Kim, B. Allouche, H.J. Hwang, B.H.Lee
    Year
    2020
    Date
    2020.06.18
    doi
    https://doi.org/10.3390/nano10061186
    File
    nanomaterials-10-01186.pdf (2.4M) 5회 다운로드 DATE : 2021-03-31 17:42:25