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    • Channel Defect Profiling and Passivation for ZnO Thin-Film Transistors
    Journal
    Nanomaterials
    Vol
    10(6)
    Page
    1186
    Author
    S.C. Kang, H.W. Jung, S.J. Chang, S.M. Kim, S.K. Lee, B.H.Lee, H.C. Kim, Y.S. Noh, S.H. Lee, S.I. Kim, H.K. Ahn, J.W. Lim
    Year
    2020
    Date
    2020.06.18
    doi
    https://doi.org/10.3390/nano10061186
    File
    nanomaterials-10-01186.pdf (2.4M) 4회 다운로드 DATE : 2021-03-31 17:42:25