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Total 532건 1 페이지

2026
532

International
"Enhanced Heavy-Ion Radiation Hardness in ZnO Thin-Film Transistors via Crystal Structure Engineering" Y.S. Lee, H.W. Lee, S.J. Kim, J.M. Park, B.H. Lee, C.G. Kang, International Reliability Physics Symposium, 2026.
531

International
"Early Detection of Random High-k Dielectric Failure using Laser-Induced Leakage-Current Mapping" J.Y.Hong, J.M. Jo, C.B.Lee, S.M.Kim, C.H.Ahn, H.J. Im, B.H. Lee, to be presented at IEEE International Reliability Physics Symposium, 2026.
2025
530

International
"Reinterpreting p-type Te FETs as SBFETs Enables Reduction of Hysteresis and Contact Resistance" M.J.Kim, U.Choi, J.H. Ban, U. Shin, H.W. Lee, G.S. Lee, B.H. Lee, IEEE International Electron Devices Meeting (IEDM), 2025.
529

Domestic
"RTA/고압수소열처리공정을 이용한 IGZO FET 특성개선효과" 신현석, 최준혁, 김기영, 이병훈, The 32th Korean Conference of Semiconductors (KCS), 2025.

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528

Domestic
"원자층 증착법을 활용한 텔루륨-셀레늄 전계 효과 트랜지스터 개발" 김민재, 김규헌, 반준호, 이경수, 이병훈, The 32th Korean Conference of Semiconductors (KCS), 2025.

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527

Domestic
"Trench SiC MOSFET용 TEOS Gate oxide 특성 연구" 박휘승, 김준, 김성준, 박영재, 민경진, 이병훈, The 32th Korean Conference of Semiconductors (KCS), 2025.

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526

Domestic
"반강유전성 ZrO2 커패시터의 내방사선 특성 연구" 이찬빈, 김승모, 김민재, 이병훈, The 32th Korean Conference of Semiconductors (KCS), 2025.

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525

Domestic
"극박막 Te-ZnO PN junction의 photomapping 분석" 이경수, 김민재, 김규헌, 반준호, 민경진, 이병훈, The 32th Korean Conference of Semiconductors (KCS), 2025.

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524

Domestic
"상보적 floating gate FET을 사용한 재구성 가능 Logic-in-Memory 회로" 신의관, 김기영, 최준혁, 이병훈, The 32th Korean Conference of Semiconductors (KCS), 2025.

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523

Domestic
"ZnO-Te 반양극성 소자를 이용한 2진/3진 융합 로직 회로 연구" 전재현, 김민재, 이해원, 이병훈, The 32th Korean Conference of Semiconductors (KCS), 2025.

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522

Domestic
"ZnO/Te 박막을 이용한 고성능 3진법 및 2진법 회로 동시 집적 연구" 김기영, 이용수, 이병훈, The 32th Korean Conference of Semiconductors (KCS), 2025.

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521

Domestic
"레이저 공정을 활용한 a-IGZO FET의 다중 문턱전압 구현방법 연구" 최준혁, 김기영, 신의관, 곽건우, 김현준, 이병훈, The 32th Korean Conference of Semiconductors (KCS), 2025.

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520

Domestic
"Raised Source/Drain 구조를 이용한 Tellurium FET의 컨택 저항 개선" 반준호, 김민재, 신의관, 김규헌, 이경수, 홍준영, 이병훈, The 32th Korean Conference of Semiconductors (KCS), 2025.

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519

Domestic
"Development of Tellurium-Based ZDT Devices for Advanced Ternary Logic Applications" G. Lee, M. Kim, H.-W. Lee, K.H. Kim, J.H. Ban, K. Min, B.H. Lee, Nano Convergence Conference (NCC), 2025.

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518

Domestic
"Multi-Vth Devices Fabrication and Simulation with Laser Annealing" U. Shin, J. Choi, K. Kim, B.H. Lee, Nano Convergence Conference (NCC), 2025.

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517

Domestic
"Characterization of TEOS Gate oxide using PE-TEOS/thermal oxide film" H. Park, J. Kim, S. Kim, Y. Park, K. Min, B.H. Lee, Nano Convergence Conference (NCC), 2025.

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2024
516

International
"Device Structure Optimization to Reduce the Hysteresis of Tellurium-Based Field-Effect Transistors" Kyuheon Kim, Minjae Kim, Hae-Won Lee, Byoung Hun Lee, Int. Conf. on Electronic Materials and Nanotechnology for Green Environment (ENGE), 2024.

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515

International
"Characteristics of Anti-Ferroelectric ZrO2 Treated with Continues Wave-Laser Scanning Annealing (CW-LSA)" Chan Bin Lee, Seung-Mo Kim, Minjae Kim and Byoung Hun Lee, Int. Conf. on Electronic Materials and Nanotechnology for Green Environment (ENGE), 2024.

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514

International
"Cryogenic Operation Characteristics of Tellurium pFETs" Minjae Kim, Kyuheon Kim, Jae Hyeon Jun, Hae-Won Lee and Byoung Hun Lee, Int. Conf. on Electronic Materials and Nanotechnology for Green Environment (ENGE), 2024.

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513

International
"BEOL-Compatible ZnO-Te Anti-ambipolar Switch for Energy-efficient Applications" Jae Hyeon Jun, Minjae Kim, Hae-Won Lee, Chan Bin Lee, Kyuheon Kim, and Byoung Hun Lee, Int. Conf. on Electronic Materials and Nanotechnology for Green Environment (ENGE), 2024.

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512

International
"1/f Noise Analysis in Ultra-Thin (sub-5 nm) ZnO nFETs" Hae-Won Lee, Minjae Kim, Jae Hyeon Jun, Chanbin Lee, Kyuheon Kim, Byoung Hun Lee, Int. Conf. on Electronic Materials and Nanotechnology for Green Environment (ENGE), 2024.

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511

International
"Reconfigurable Logic-in-Memory (LIM) Device using Complementary Floating Gate Field Effect Transistor" Uigwan Shin, Kiyung Kim, Junhyeok Choi and Byoung Hun Lee, Int. Conf. on Electronic Materials and Nanotechnology for Green Environment (ENGE), 2024.

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510

International
"High Performance Ternary and Binary Circuit Integration using ZnO/Te Thin-film" Kiyung Kim, Yongsu Lee, and Byoung Hun Lee, Int. Conf. on Electronic Materials and Nanotechnology for Green Environment (ENGE), 2024.

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509

International
"Characterization of ferroelectric annealing using Continues Wave-Laser Scanning Annealing (CW-LSA)" Chan Bin Lee, Seung-Mo Kim, Minjae Kim and Byoung Hun Lee, NANO KOREA, 2024.

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508

International
"Characterization of ALD-grown Tellurium FETs as a function of precursor pressure" Kyuheon Kim, Minjae Kim, Hae-Won Lee, Byoung Hun Lee, NANO KOREA, 2024.

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507

International
"Effect of High-Pressure Hydrogen Annealing on Ultra-Thin ZnO Field Effect Transistor" Hae-Won Lee, Inseo Baek, Yongsu Lee, Minjae Kim, Kyuheon Kim, Chanbin Lee, Hyeon Jun Hwang, Byoung Hun Lee, NANO KOREA, 2024.

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506

International
"Radiation hardness of high-performance Te pFET via Al2O3 passivation" Minjae Kim, Kyuheon Kim, Hae-Won Lee, Jae Hyeon Jun, Chan bin Lee and Byoung Hun Lee, NANO KOREA, 2024.

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505

International
"Demonstration of ZnO-Te Anti-ambipolar Switch Compatible with BEOL for Energy-efficient System" Jae Hyeon Jun, Minjae Kim, Hae-Won Lee, Chan Bin Lee, Kyuheon Kim, and Byoung Hun Lee, NANO KOREA, 2024.

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504

International
"High performance Te/ZnO CMOS inverter operated at 77K" Minjae Kim, Kiyung Kim, Kyuheon Kim, Jae Hyeon Jun, Hae-won Lee and Byoung Hun Lee, 2024 IEEE Silicon Nanoelectronics Workshop (SNW), .

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503

International
"Ultra-thin and High-quality Pt-Silicidation using CW Laser Annealing Process" Seung Mo Kim, Min Gyu Kwon, Taekyu Woo, Ki Sung Kim, Yongsu Lee, Hyeon Jun Hwang, Joon Kim1 and Byoung Hun Lee, 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA), 2024.

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