Conferences 1 페이지 | 포항공대 EESL

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Total 3건 1 페이지

2026
3

International
"Radiation Induced Instability Mechanism and Hardening Method of Nanoscale Devices" C.G. Kang, S.J. Kim, Y.S. Lee, J.M. Park, S.K. Hwang, Y.H. Kim, H.W.Lee, B.H.Lee, International Reliability Physics Symposium, 2026.
2

International
"Enhanced Heavy-Ion Radiation Hardness in ZnO Thin-Film Transistors via Crystal Structure Engineering" Y.S. Lee, H.W. Lee, S.J. Kim, J.M. Park, B.H. Lee, C.G. Kang, International Reliability Physics Symposium, 2026.
1

International
"Early Detection of Random High-k Dielectric Failure using Laser-Induced Leakage-Current Mapping" J.Y.Hong, J.M. Jo, C.B.Lee, S.M.Kim, C.H.Ahn, H.J. Im, B.H. Lee, to be presented at IEEE International Reliability Physics Symposium, 2026.

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