포항공대 EESL Fearless challenge

Weak Pinning Effects at Metal/High-k Dielectric Stack Integrated for Top Gate Graphene Field Effect Transistors

Conference

Nano Korea

Author

So-Young Kim, Yun Ji Kim, Ukjin Jung, Byoung Hun Lee

Year

2015

Date

2015, Best poster award

학회구분

International

File

2015_Nano-Korea-_SYKIM.pdf (1.5M) 1회 다운로드 DATE : 2021-04-01 19:45:58