포항공대 EESL Fearless challenge

Fermi Pinning Effects at Metal/High-k Dielectric Stack Integrated for Top Gate Graphene Field Effect Transistors

Conference

IUMRS

Author

So-Young Kim, Yun Ji Kim, Ukjin Jung, and Byoung Hun Lee

Year

2015

Date

2015, Best poster award

학회구분

International

File

2015_IUMRS_SYKim.PDF (883.2K) 1회 다운로드 DATE : 2021-04-01 19:52:17