포항공대 EESL Fearless challenge

Mechanism of subthreshold swing degradation in p-type tunnel FETs

Conference

SISC

Author

U. Jung, S.M. Kim, D. Lim, K.E. Chang, Y.J. Kim, S.C. Kang, S.K. Lim, C. Choi and B.H. Lee

Year

2015

Date

2015

학회구분

International

File

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