포항공대 EESL Fearless challenge

Gate stack technology for nano-scale devices

Conference

Proceedings of IEEE Nanotech. Mat. And Dev. conf., p.206

Author

B. H. Lee,, P.Kirsch, S.Song, R.Choi and R.Jammy

Year

2006

Date

2006 (invited)

학회구분

International

File

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