목록 게시판 리스트 옵션 검색 Comparison of novel BTI measurements for high-k dielectric MOSFETs Conference ICSICT Author R. Choi, D. Heh, C.Y. Kang, C. Young, G. Bersuker, B. H. Lee Year 2006 Date 2006 학회구분 International File 2006_ICSICT_RCHOI.pdf (147.6K) 0회 다운로드 DATE : 2021-04-02 12:54:01 R. Choi, D. Heh, C.Y. Kang, C. Young, G. Bersuker, B. H. Lee, “Comparison of novel BTI measurements for high-k dielectric MOSFETs”, ICSICT, (2006).
