목록 게시판 리스트 옵션 검색 NBTI analysis methodology for high-k gate stacks Conference discussed at SISC Author G.Bersuker, A.Neugroschel, R.Choi, C.Cochrane, P.Lenahan, D.Heh, C.Young, C.Y.Kang, B. H. Lee and R.Jammy Year 2006 Date 2006 학회구분 International G.Bersuker, A.Neugroschel, R.Choi, C.Cochrane, P.Lenahan, D.Heh, C.Young, C.Y.Kang, B. H. Lee and R.Jammy, “NBTI analysis methodology for high-k gate stacks”, discussed at SISC, (2006).
