A novel in situ plasma treatment for damage-free metal/high-k gate stack RIE proces
Conference
IEDM
Author
B.S.Ju, S.C.Song, T.H.Lee, B.Sassman, C.Y.Kang, B. H. Lee, R.Jammy
Year
2006
Date
2006
학회구분
International
File
2006_IEDM_BSJU.pdf (1.0M) 0회 다운로드 DATE : 2021-04-02 13:02:24