포항공대 EESL Fearless challenge

A Study on the Electrical Characterization methods for CdS channel MOSFETs

Conference

18th Korean Conference on Semiconductors (KCS)

Author

U.J. Jung, Y.G. Lee, J.J. Kim, I. Mejia, A. Salas-Villasenor, M. Quevedo-Lopez, J. Kim and B.H. Lee

Year

2011

Date

2011

학회구분

Domestic

File

2011_KCS_UJJUNG.pdf (5.3M) 0회 다운로드 DATE : 2021-04-02 14:23:11