목록 게시판 리스트 옵션 검색 Passivation effects of low temperature ALD Al2O3 gate dielectric for graphene FET Conference 18th Korean Conference on Semiconductors (KCS) Author C.G. Kang, Y.G. Lee, S.K. Lee, H.J. Hwang, C.H. Cho, S.K. Lim, S.Y. Lee, E.J. Park, J. Heo, H.J. Chung, H. Yang, S. Seo and B.H. Lee Year 2011 Date 2011 학회구분 Domestic File 2011_KCS_CGKANG.pdf (4.9M) 0회 다운로드 DATE : 2021-04-02 14:24:24
