목록 게시판 리스트 옵션 검색 Comparative study of TiO2 and Ta2O5 on JVD nitride as an alternative gate dielectrics Conference Proceedings of 29th IEEE SISC Author B. H. Lee, Y. Jeon, A. Lucas, M. Gilmer, M. Gardner, J. Fair and J. C. Lee Year 1998 Date 1998 학회구분 International
