목록 Characterization of ultra-thin dielectric using time domain reflectometry Conference Int. Workshop on Dielectric Thin Films. (IWDTF) Author Y.H. Kim, S.H.C. Baek, C.H. Jeon, Y.G. Lee, J.J. Kim, U.J. Jung, S.H. Lee, and B.H. Lee Year 2013 Date 2013 학회구분 International File 2013_IWDTF_YHKIM.pdf (487.1K) 0회 다운로드 DATE : 2021-04-02 14:44:09
