목록 Novel Method to Extract the Defect Levels of Charge Traps at Top Gate Graphene FETs Conference Int. Conf. on Electronic Materials and Nanotechnology for Green Environment (ENGE) Author U.Jung, Y.Kim, S.Lee B.H.Lee Year 2014 Date 2014 학회구분 International File 2014_ENGE_UJUNG.pdf (839.3K) 0회 다운로드 DATE : 2021-04-02 15:01:44
