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    • Dominant SILC mechanisms in HfO2/TiN gate NMOS and PMOS transistors
    Conference
    Proc. of IRPS
    Author
    S.A. Krishnan, J.J. Peterson, C. Young, G. Brown, R. Choi, R. Harris, J. Sim, B.H. Lee, P. Zeitzoff, P. Kirsch, J. Gutt, H.J. Li, K. Matthews, J.C. Lee, G. Bersuker
    Year
    2005
    Date
    2005
    학회구분
    International
    File
    2005_IRPS_SAKRISHNAN.pdf (479.0K) 0회 다운로드 DATE : 2021-04-03 21:18:01

    S.A. Krishnan, J.J. Peterson, C. Young, G. Brown, R. Choi, R. Harris, J. Sim, B. H. Lee, P. Zeitzoff, P. Kirsch, J.Gutt, H.J. Li, K. Matthews, J.C. Lee, and G. Bersuker, “Dominant SILC mechanisms in HfO2/TiN gate NMOS and PMOS transistors”, Proc. of IRPS, p.642, (2005).