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    • Hot carrier and cold carrier studies during stress in Hf-silciate NMOS transistors with Poly and TiN gate stack
    Conference
    Proc. of IRPS
    Author
    J.H. Sim, B.H. Lee, S.C. Song, C.D. Young a, R. Choi, H. Rusty Harris, G. Bersuker
    Year
    2005
    Date
    2005
    학회구분
    International

    J. H. Sim, B. H. Lee, S. C. Song, C. D. Young a, R. Choi, H. Rusty Harris and G. Bersuker, “Hot carrier and cold carrier studies during stress in Hf-silciate NMOS transistors with Poly and TiN gate stack”, Proc. of IRPS, p.638, (2005).