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    • Threshold voltage instability of HfSiO dielectric MOSFET under AC pulsed stress
    Conference
    Proc. of IRPS
    Author
    R. Choi, R. Harris, B.H. Lee, C.D. Young, J.H. Sim, K. Matthews, M. Pendley, G. Bersuker
    Year
    2005
    Date
    2005
    학회구분
    International
    File
    2005_IRPS_RCHOI-2.pdf (459.8K) 0회 다운로드 DATE : 2021-04-03 21:26:11

    R. Choi, R. Harris, B. H. Lee, C.D. Young, J.H. Sim, K. Matthews, M. Pendley and G. Bersuker, “Threshold voltage instability of HfSiO dielectric MOSFET under AC pulsed stress”, Proc. of IRPS, p.634, (2005).