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    • Cold and Hot Carrier effects on HfO2 and HfSiO NMOSFETS with TiN gate electrode
    Conference
    Proc. of DRC
    Author
    J.H. Sim, S.C. Song, R. Choi, C.D. Young, G. Bersuker, S.H. Bae, D.L. Kwong, B. H. Lee
    Year
    2005
    Date
    2005
    학회구분
    International
    File
    2005_DRC_JHSIM.pdf (1.0M) 0회 다운로드 DATE : 2021-04-03 21:29:32

    J.H. Sim, S.C. Song, R. Choi, C.D. Young, G. Bersuker, S.H. Bae, D.L. Kwong and B. H. Lee, “Cold and Hot Carrier effects on HfO2 and HfSiO NMOSFETS with TiN gate electrode”, Proc. of DRC, (2005).