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    • On the Structure-Property Inter-Relationships of Metal Gate Electrodes for Future Generation CMOS
    Conference
    ISTC
    Author
    P. Majhi, H. Alshareef, H.-C. Wen, K. Choi, P. Lysaght, C. Huffman, H. Luan, R. Harris, B.H. Lee, C. Ramiller
    Year
    2005
    Date
    2005, invited
    학회구분
    International

    P. Majhi, H. Alshareef, H.-C. Wen, K. Choi, P. Lysaght, C. Huffman, H. Luan, R. Harris, B. H. Lee and C. Ramiller, "On the Structure-Property Inter-Relationships of Metal Gate Electrodes for Future Generation CMOS", ISTC, (2005), Invited.