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    • Evaluation and Integration of Metal Gate Electrodes for Future Generation Dual Metal CMOS
    Conference
    Proc. of ICICDT
    Author
    P. Majhi, H.C. Wen, H. Alshareef, K. Choi, R. Harris, P. Lysaght, H. Luan, Y. Senzaki, S.C. Song, B.H. Lee, C. Ramiller
    Year
    2005
    Date
    2005, invited
    학회구분
    International
    File
    2005_ICICDT_PMAJHI.pdf (649.4K) 0회 다운로드 DATE : 2021-04-03 21:32:31

    P. Majhi, H.C. Wen, H. Alshareef, K. Choi, R. Harris, P. Lysaght, H. Luan, Y. Senzaki, S. C. Song, B. H. Lee, and C. Ramiller, “Evaluation and Integration of Metal Gate Electrodes for Future Generation Dual Metal CMOS”, Proc. of ICICDT, p.69, (2005), Invited.