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    • Charge Trapping in n-MOSFETs with TiN/HfSixOy/SiO2/p-Si Gate Stack during Substrate Injection
    Conference
    ECS spring
    Author
    P. Srinivasan , N.A. Chowdhury, A. Peralta, D. Misra, R. Choi, B.H. Lee
    Year
    2005
    Date
    2005
    학회구분
    International

    P. Srinivasan , N. A. Chowdhury, A. Peralta, D. Misra, R.Choi and B. H. Lee, “Charge Trapping in n-MOSFETs with TiN/HfSixOy/SiO2/p-Si Gate Stack during Substrate Injection”, ECS spring, (2005).