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    • Interfacial layer properties in high-k gate dielectric transistors
    Conference
    ECS spring meeting
    Author
    G. Bersuker, J. Peterson, J. Barnet, J. Sim, R. Choi, B.H. Lee, P. Lysaght, H.R. Huff
    Year
    2005
    Date
    2005
    학회구분
    International

    G. Bersuker, J. Peterson, J. Barnet, J. Sim, R. Choi, B. H. Lee, P. Lysaght, H. R. Huff, “Interfacial layer properties in high-k gate dielectric transistors”, ECS spring meeting, (2005).