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    • Transient charging effects and its implication to the reliability of high-k dielectrics
    Conference
    NATO Workshop on defect in high-k dielectrics, St. Petersburg
    Author
    B.H. Lee, R. Choi, C. Young, J. Sim, G. Bersuker
    Year
    2005
    Date
    2005, invited
    학회구분
    International

    B. H. Lee,, R.Choi, C.Young, J.Sim and G.Bersuker,“Transient charging effects and its implication to the reliability of high-k dielectrics”, NATO Workshop on defect in high-k dielectrics, St. Petersburg, (2005), Invited.