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    • Electrical Characterization Methodologies for Advanced Gate Stacks with Metal gate and High-k dielectrics
    Conference
    International Semiconductor Technology Conference
    Author
    B.H. Lee, G. Bersuker, N. Moumen, P. Majhi, P. Kirsch, S.C. Song, C. Ramiller
    Year
    2005
    Date
    2005, invited
    학회구분
    International

    B. H. Lee,, G. Bersuker, N. Moumen, P. Majhi, P. Kirsch, S.C. Song and C. Ramiller, “Electrical Characterization Methodologies for Advanced Gate Stacks with Metal gate and High-k dielectrics”, International Semiconductor Technology Conference, (2005), Invited.