목록 게시판 리스트 옵션 검색 ZrO2 , Zr-silicate, and HfO2 Gate Dielectrics Conference the Paris Future Development Conference Author J. Lee, B. H. Lee, W.Qi, R.Nieh, L.Kang, Y.Jeon, and K.Onishi Year 2000 Date 2000, invited 학회구분 International
