A Study on the Degradation Mechanism of Vertical Stacked ZnO TFT
Conference
Int. Conf. on Electronic Materials and Nanotechnology for Green Environment (ENGE)
Author
S.M.Kim, H.I.Lee, S.Y.Kim, Y.S.Lee, H.J.Hwang, and B.H.Lee*
Year
2020
Date
2020
학회구분
International
File
2020_ENGE_KSM.pdf (697.7K) 2회 다운로드 DATE : 2021-04-04 14:15:40