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A Study on the Degradation Mechanism of Vertical Stacked ZnO TFT

Conference

Int. Conf. on Electronic Materials and Nanotechnology for Green Environment (ENGE)

Author

S.M.Kim, H.I.Lee, S.Y.Kim, Y.S.Lee, H.J.Hwang, and B.H.Lee*

Year

2020

Date

2020

학회구분

International

File

2020_ENGE_KSM.pdf (697.7K) 3회 다운로드 DATE : 2021-04-04 14:15:40