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    • A novel inversion pulse measurement technique to investigate transient charging characteristics in high-k NMOS transistors
    Conference
    Ext. Abs. of Symp. on Solid State Device and Materials
    Author
    R. Choi, B.H. Lee, H.K. Park, C.D. Young, J.H. Sim, S.C. Song, G. Bersuker
    Year
    2005
    Date
    2005
    학회구분
    International

    R. Choi, B. H. Lee, H. K. Park, C.D. Young, J.H. Sim, S.C. Song and G. Bersuker, “A novel inversion pulse measurement technique to investigate transient charging characteristics in high-k NMOS transistors”, Ext. Abs. of Symp. on Solid State Device and Materials, (2005).