A novel inversion pulse measurement technique to investigate transient charging characteristics in high-k NMOS transistors
Conference
Ext. Abs. of Symp. on Solid State Device and Materials
Author
R. Choi, B.H. Lee, H.K. Park, C.D. Young, J.H. Sim, S.C. Song, G. Bersuker
Year
2005
Date
2005
학회구분
International

R. Choi, B. H. Lee, H. K. Park, C.D. Young, J.H. Sim, S.C. Song and G. Bersuker, “A novel inversion pulse measurement technique to investigate transient charging characteristics in high-k NMOS transistors”, Ext. Abs. of Symp. on Solid State Device and Materials, (2005).