포항공대 EESL Fearless challenge

MOSFET Devices with Polysilicon Electrode on Single-Layer HfO2 High-K Dielectrics

Conference

Tech. Dig. of International Electron Device Meetings

Author

L. Kang, K. Onishi, Y.Jeon, B. H. Lee, C.S> Kang; W.-J. Qi, R. Nieh, S. Gopalan; R. Choi, Jack C. Lee

Year

2000

Date

2000

학회구분

International

File

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