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    • Detection of Trap Generation in High-k Gate Stacks due to Constant Voltage Stress
    Conference
    Proc. of Int. Integrated Rel. Workshop
    Author
    C.D. Young, D. Heh, S. Nadkarni, R. Choi, J.J. Peterson, H.R. Harris, J.H. Sim, S.A. Krishnan, J. Barnett, E. Vogel, B.H. Lee, P. Zeitzoff, G.A. Brown, G. Bersuker
    Year
    2005
    Date
    2005
    학회구분
    International

    C.D. Young, D. Heh, S. Nadkarni, R. Choi, J.J. Peterson, H.R. Harris, J.H. Sim, S.A. Krishnan, J. Barnett, E. Vogel, B. H. Lee, P. Zeitzoff, G.A. Brown, and G. Bersuker, “Detection of Trap Generation in High-k Gate Stacks due to Constant Voltage Stress”, Proc. of Int. Integrated Rel. Workshop, p.78, (2005).