목록 게시판 리스트 옵션 검색 Test Structures for Accurate UHF C-V measurement for Nano-Scale CMOSFETs with HfSiON and TiN Tetal Gate Conference ICMTS Author K.T. Lee, G.A. Brown, H. Dawei, R. Choi, S.C. Song, B. H. Lee, O.S. Yoo, H.D Lee and Y-H Jeong Year 2007 Date 2007 학회구분 International File 2007_ICMTS_KTLEE.pdf (3.6M) 0회 다운로드 DATE : 2021-04-05 00:33:48
