목록 Electrical Characterization Methodologies for the Assessment of High-k Gate Dielectric Stacks Conference ECS Trans. Author C.D. Young, G. Bersuker, D. Heh, R. Choi, C.Y. Kang, J. Tun, and B. H. Lee Year 2007 Date 2007 학회구분 International File 2007_ECS-TRANS_CDYOUNG.pdf (870.8K) 0회 다운로드 DATE : 2021-04-05 00:41:08
