포항공대 EESL Fearless challenge

Integration Challenges and Opportunities for Nanometer Scale Dual Metal Gate CMOSFET

Conference

ECS Trans.

Author

S. C. Song, M. Hussain, J. Barnett, C. S. Park, C. Park, P. Kirsch, and B. H. Lee

Year

2007

Date

2007

학회구분

International

File

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