High and low stress voltage instabilities in high-k gate stacks
Conference
ECS Trans.
Author
G. Bersuker, C. Young, D. Heh, R. Choi, B. H. Lee and R. Jammy
Year
2007
Date
2007
학회구분
International
File
2007_EC-TRANS_GBERSUKER.pdf (161.8K) 0회 다운로드 DATE : 2021-04-05 01:32:58