포항공대 EESL Fearless challenge

High and low stress voltage instabilities in high-k gate stacks

Conference

ECS Trans.

Author

G. Bersuker, C. Young, D. Heh, R. Choi, B. H. Lee and R. Jammy

Year

2007

Date

2007

학회구분

International

File

2007_EC-TRANS_GBERSUKER.pdf (161.8K) 0회 다운로드 DATE : 2021-04-05 01:32:58