목록 게시판 리스트 옵션 검색 Hot Carrier Reliability of HfSiON NMOSFETs with Poly and TiN metal gate Conference Proc. of Device Research Conference Author J. H. Sim, B. H. Lee, R. Choi, K. Matthews, D.L. Kwong , P. Tsui, and G. Bersuker Year 2004 Date 2004 학회구분 International File 2004_DRC_J.H.Sim.pdf (144.7K) 0회 다운로드 DATE : 2021-04-05 01:53:12
