포항공대 EESL Fearless challenge

Hot carrier reliability of HfSiON PMOSFETs with Metal gate

Conference

International symposium on the physical and failure analysis of integrated circuits (IPFA)

Author

J.H.Sim, B. H. Lee, R.Choi, K.Matthew, P.Zeitzoff, and G.Bersuker

Year

2004

Date

2004

학회구분

International

File

2004_IPFA_J.H.Sim.pdf (165.9K) 0회 다운로드 DATE : 2021-04-05 01:55:52