포항공대 EESL Fearless challenge

Effect of pre-existing defects on reliability assessment of high-k gate dielectrics

Conference

ESREF

Author

G.Bersuker, J.H.Sim, C.Young, R.Choi, P.Zeizoff, G,Brown, B. H. Lee and R.A.Murto

Year

2004

Date

2004

학회구분

International

File

2004_ESREF_G.Bersuker.pdf (775.9K) 0회 다운로드 DATE : 2021-04-05 02:03:42