목록 게시판 리스트 옵션 검색 Effective Minimization of Charge-trapping in High-k gate Dielectrics with an Ultra-short Pulse Technique Conference 7th International Conference on Solid-State and Integrated Circuits Technology Author Y. Zhao, C.D. Young, M. Pendley, K. Matthews, B. H. Lee and G.A. Brown Year 2004 Date 2004 학회구분 International File 2004_SSICT_Y.Zhao.pdf (744.0K) 0회 다운로드 DATE : 2021-04-05 02:06:19
