목록 게시판 리스트 옵션 검색 A Study of Charge Trapping Dynamics in HfSiON Dielectrics Using the Single Stage Inverter Circuit Conference SISC Author C. Y. Kang, R. Choi, H. Rusty, B. H. Lee, G. Bersuker, and Jack C. Lee Year 2004 Date 2004 학회구분 International
