목록 게시판 리스트 옵션 검색 The frequency dependence of AC stress induced charging and it’s relaxation in TiN/Hf-Silicate NMOSFETs Conference SISC Author R. Choi, Rusty Harris, B. H. Lee, K. Matthews, Mike Pendley, Chadwin Young, J. H. Sim, G. Bersuker Year 2004 Date 2004 학회구분 International
