포항공대 EESL Fearless challenge

C.Y. Kang, R. Choi, J. H. Sim, C. Young, B. H. Lee, G. Bersuker and Jack C. Lee

Conference

Tech Dig. of IEDM

Author

Charge Trapping Effects in HfSiON dielectrics on the Ring Oscillator Circuit and the Single Stage Inverter Operation

Year

2004

Date

2004

학회구분

International

File

2004_TDIEDM_CYKANG.pdf (243.2K) 0회 다운로드 DATE : 2021-04-05 02:11:16