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Recovery of NBTI degradation in HfSiON /Metal Gate Transistors

Conference

Integrated Rel. Workshop

Author

H. Rusty Harris, R. Choi, B. H. Lee, C. D. Young, J. H. Sim, K. Mathews, P. Zeitzoff, P. Majhi, and G. Bersuker

Year

2004

Date

2004

학회구분

International

File

2004_PRIW_HRHARRIS.pdf (259.9K) 0회 다운로드 DATE : 2021-04-05 02:19:21