목록 게시판 리스트 옵션 검색 1/f Noise Analysis in Ultra-Thin (sub-5 nm) ZnO nFETs Conference Int. Conf. on Electronic Materials and Nanotechnology for Green Environment (ENGE) Author Hae-Won Lee, Minjae Kim, Jae Hyeon Jun, Chanbin Lee, Kyuheon Kim, Byoung Hun Lee Year 2024 Date 2024 학회구분 International File ENGE_2024_이해원.pdf (164.1K) 4회 다운로드 DATE : 2024-08-20 13:18:54
